BeamFiler NIR Series
Beam Profiler — NIR Laser Beam Profiling System
High-resolution NIR beam profilers for 300-1100nm laser characterization. USB3.0 & GigE interfaces, 2.4μm pixel resolution, M² beam quality measurement, up to 50W power handling. Request a quote from Wavelength Optics USA.
View full Beam Profiler Catalogue here
Spectral Range
Minimum Pixel Size
Data Interfaces
Max Power Handling
Specifications
| Part No. | Wavelength | Pixel Size | Target Size | Spot Size Range | Interface | Attenuator | Max Power |
|---|---|---|---|---|---|---|---|
| E0-BFN0205G | 300-1100nm | 2.4μm | 7.4×4.9mm | 24.0μm - 4.9mm | GigE | Magnet / C-Mount | 1W |
| E0-BFN0307U | 300-1100nm | 3.45μm | 8.4×7.1mm | 34.5μm - 7.1mm | USB3.0 | Magnet / C-Mount | 1W |
| E10N-BFN0205G | 300-1100nm | 2.4μm | 7.4×4.9mm | 24.0μm - 4.9mm | GigE | Slot | 50W |
| E10N-BFN0307U | 300-1100nm | 3.45μm | 8.4×7.1mm | 34.5μm - 7.1mm | USB3.0 | Slot | 50W |
* Full-band product models shown for reference. Contact us for customization based on your specific test requirements.
The BeamFiler NIR Series is a high-resolution laser beam profiler designed for precise characterization of laser beams across the 300–1100nm near-infrared spectral range. Whether you’re aligning a fiber laser, qualifying a diode module, or profiling a pulsed Nd:YAG system, the BeamFiler delivers the real-time beam width, centroid, ellipticity, and M² data your process demands.
Available in two form factors — a compact 1W configuration with magnetic or C-mount attenuator adaptor for low-power lab use, and a high-power 50W slot-attenuated version for industrial laser systems — the BeamFiler covers applications from R&D prototyping to production-floor beam monitoring. With pixel sizes as small as 2.4μm and spot size measurement from 24.0μm to 7.1mm, it handles everything from tightly focused micro-machining beams to larger collimated outputs used in additive manufacturing and medical laser systems.
Both USB3.0 and GigE interfaces are supported, making integration straightforward whether you need a single benchtop station or a networked multi-profiler setup across a production line.
Why Choose the BeamFiler for Your US Operation?
Wavelength Optics provides direct US-based support, fast quoting, and technical consultation for beam profiler selection. We help you match the right sensor resolution, interface, and power handling to your specific laser wavelength and application — whether that’s semiconductor wafer inspection, laser welding quality control, or medical device manufacturing.
Included Software
Ships with Windows-based beam analysis software (Win 10+, 8GB RAM). Key capabilities:
- Visualization — 2D, 3D, and XY section views with multiple ROIs and real-time beam parameter overlay
- Measurement — M² beam quality, beam stability tracking (peak, centroid X/Y, beam width D4σ/DPK/DT), directivity detection, and power calibration
- Analysis — Auto exposure, threshold calculation, CW and pulse modes with software triggering, multi-beam detection
- Export — CSV data, BMP/PNG images, 8-bit grayscale, video capture with playback, and automated report generation
Need Help Choosing the Right Model?
Our photonics specialists can help you select the optimal configuration for your system. Custom specifications available on request.